Particle contamination in liquids has a significant impact on product quality, and the characteristics of particles suspended in liquids have an impact on human consumption, making the control of particles in liquids particularly important in a variety of fields.

Particle contamination in liquids has a significant impact on product quality, and the properties of particles suspended in liquids have an impact on human consumption, making the control of particles in liquids particularly important in a variety of fields.
 RION/Japan's Liquid Particle Counters are designed to detect a wide variety of liquids from pure water to hydrofluoric acid. Liquid counters are used to control particles in chemicals such as specialized materials for semiconductor processes such as SOG and photoresist materials, ultrapure water, and cleaning chemicals (e.g., alkalis, organic solvents, and hydrofluoric acid). In addition, abrasive fluids with large particle sizes for chemical-mechanical polishing can also be tested, both online and offline.

Pure water and chemical fluids are used in large quantities in the production of semiconductors, hard disk drives, and flat panel displays. The control of particles in liquids is particularly necessary to achieve miniaturization of electronic devices and improvements in the quality and yield of large-scale integrated circuits.
Particle size requirements in semiconductor production lines and sites have been reduced to less than 0.1μm. However, in hard disk drive production, the particle size requirement for head cleaning is 0.01μm. Due to the large size of large screens in flat panel display production, the particle size requirement is 0.01μm. The particle size requirement for head cleaning is 0.01μm. The particle size requirement for head cleaning is 0.01μm. Flat-panel display production of large-screen and high-quality television sets and monitors, in 1 to 2 square meters of glass substrate is not allowed to appear point defects. Therefore, in order to ensure improved results in microfabrication technology and the production of high-performance electronic devices, it is important to control the surrounding particles. Liquid particle counters play an important role as monitoring qualitative devices.
Using a liquid particle counter effectively performs particle detection, clarifies the relationship between various elements and throughput, production, and so on, and effectively addresses problem areas. By connecting the particle counter directly to the supply line of the cleaning tank and the recirculation line where constant monitoring is performed, the fluctuation of particles can be determined, and the production line can be improved scientifically.
KS-42A/AF 

Optical System:Diffuse Optical System 
RADIUM LIGHT SOURCE:Semiconductor Radium Diode, Intensity. 200mW Wavelength:830nm
Radium Source Class:Class 1, IEC 60825-1 (2001) 
Radium Source Class:Class 1, IEC 60825-1 (2001) 
Receiver:Light Detector 
Flow Rate:10ml/min 
Detecting particle size:0.1um~0.5um (10ch optional) (retrofittable to 1.0um) 
Calibration method:Use latex polystyrene standard particles (PSL) to calibrate the particle size. particles 
Maximum Concentration:1,200pcs/ml (Tolerance±5%) 
Withstand Pressure:300kPa 
Leakage Alarm:Connect Relay 
Dimensions:125(H)*240(W)*251(D) mm (Excluding external connections) 
Weight:Approx. 4kg
KS-42B/BF

Optical System:Scattering Optical System 
Laser Light Source:Semiconductor Laser Diode, Intensity:40mW Wavelength:780nm
镭射光源等级:Class 1, IEC 60825-1 (2001) 
接收器:光检知器 
Flow Rate:10ml/min 
Particle Size:0.2um~2.0um(10ch optional) 
Calibration method:using latex polystyrene standard (PSL) particles 
Maximum concentration. 1,200pcs/ml (Tolerance±5%) 
Available Pressure:300kPa 
Leakage Alarm:Connection Relay Dimensions:125(H)*240(W)*151(D) mm (excluding external connections)
  Weight:Approx. 3.2kg
KS-42C

Optical System:Diffuse Optical System
Laser Source:Semiconductor Laser Diode, Intensity:5mW Wavelength:780nm
Laser Source Class 1, IEC 60825-1 (2001) 
Receiver:Light Detector
Flow Rate:10 ml/kg.
Receiver:Light Detector
Flow Rate:10ml/min 
Detecting Particle Size:0.5um~20um(10ch optional) 
Detecting Particle Size:0.5um~20um(10ch optional) 
Receiver:Light Detector
Calibration method:Use latex polystyrene standard (PSL) particles 
Maximum concentration:1,200pcs/ml (error amp;amp;plusmnbsp;5%). amp;amp;plusmn;5%)
Capable of withstanding pressure:300kPa 
Leakage Alarm:Connection Relay Dimensions:125(H)*240(W)*151(D) mm (excluding external connections) 
Weight:Approx. 3kg
Weight:Approx. 3kg
KS-19F

Optical system:scattering optical system 
Laser Source:Solid State Laser, Intensity:800mW Wavelength:532nm
Light Source Class:Class 1, IEC 60825-1 (2001 )
Receiver:Multi-Channel Light Detector 
Flow Rate:10ml/min
Detect particle size:0.03um~0.13um (optional 10ch) 
Calibration method:using latex Polystyrene standard (PSL) particles
Recommended concentration:40,000pcs/ml (tolerance ±10%);
Recommended concentration:40,000pcs/ml (tolerance ±10%);
Specialty:10ch
Withstand Pressure:300kPa
Leakage Alarm:Connect Relay
Relay:Connect Relay. quot;/>Dimensions:170(H)*487(W)*310(D) mm (excluding externally connected accessories) 
Weight:Approx. 13.5 kg
KS-20F

Optical system:scattering optical system
Laser Source:Solid State Laser, Intensity:1.5W Wavelength:532nm
Light Source Class:Class 1, IEC 60825-1 (2001)
Receiver:Multi-Channel Light Detector
Flow Rate:10ml/min
The flow rate is 10ml/min. align:left;"/>Particle size:0.02um~0.08um (7ch optional) 
Suggested concentration:50,000pcs/ml (within 10% error) 
Receiver:Multi-Channel Light Detector lt;br style="text-align:left;"/>Withstand Pressure:300kPa
Leakage Alarm:Connect Relay
Dimensions:230(H)*550(W)*330(D) mm (excluding external connections) 
Weight:approx. 17Kg. lt;br style="text-align:left;"/>