
The Model 3086 1nm-DMA Differential Electrostatic Migration Analyzer is typically used in conjunction with the TSI Model 3082 Electrostatic Classifier, Model 3777 NanoEnhancer, and Coalescing Particle Counter, and the analyzer's workflow has been optimized to not only minimize fugitive losses but also to increase the resolution of particle size measurements for particles from 1nm to 50nm.
Analyzes particles from 1 to 50 nm in size
Key component of SMPS (Scanning Mobility Particle Sizing Spectrometer)
Particle size measurement

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