The 3086 1nm-DMA differential electrostatic mobility analyzer is generally used in conjunction with the TSI 3082 electrostatic classifier, 3777 nano-enhanced instrument and condensation particle counter, and the analyzer workflow has been optimized to not only minimize dissipation losses, but also improve the particle size resolution of particle size measurements from 1nm to 50nm.

Features and advantages

Analyze particles from 1 to 50nm

Key components of SMPS (Scanning Mobility Particle Sizer)

Application scope

Particle size measurement